Document Type

Conference Proceeding

Conference

NAIT 2007 Conference

Publication Date

10-2007

City

Panama City Beach, FL

Abstract

To compete in a global marketplace, manufacturers are increasingly turning to advanced manufacturing techniques to increase productivity and gain a competitive advantage. This trend requires management to be able to make decisions based on proper quantitative analysis of data. In the manufacturing process, control of variation with an increasingly high degree of precision demands an improved degree of measurement effectiveness. Measurement Systems Analysis (MSA) is a collection of statistical methods (which includes the Gauge Repeatability and Reproducibility study) for the analysis of measurement system capability (Automotive Industry Action Group [AIAG], 2002; Smith, McCrary, & Callahan, 2007).

Comments

The paper, "Gauge R&R: An Effective Methodology for Determining the Adequacy fo a New Measurement System for Micron-level Metrology" (David W. Hoffa and Chad M. Laux), as published in the Proceedings of the NAIT 2007 Conference (2007 NAIT Annual Conference, Panama City Beach, FL, October 23–27, 2007)" is a copyrighted publication of ATMAE, the Association of Technology, Management, and Applied Engineering, 1390 Eisenhower Place, Ann Arbor, MI 48108 This paper has been republished with the authorization of ATMAE, and may be accessed directly from the ATMAE website at http://atmae.org/index.php/conference-20#pastconfpaper.

Copyright Owner

ATMAE

Language

en

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