Irreversible Structural Transformation of five fold i-AlPdMn Quasicrystals after Ion Bombardment and Annealing

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2000-01-01
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Schmithüsen, Frank
Cappello, Giovanni
Decossas, S.
Torricelli, G.
Lee, T.-L.
de Boissieu, Marc
Calvayrac, Y.
Lograsso, Thomas
Comin, Fabio
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Lograsso, Thomas
Ames Laboratory Division Director
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Ames National Laboratory
Abstract

Five fold i-AlPdMn surface prepared under UHV by ion bombardment and annealing was so far considered to be bulk terminated. This result was substantially based on a quantitative LEED analyses [1]. Analysis of the specular rod in a X ray diffraction experiment at grazing incidence supported this result [2]. We present a new study of this surface by high resolution X ray diffraction at normal incidence. In this Bragg configuration the diffraction peak 18 – 29 for instance is at a photon energy of 2.873keV, the 72 – 116 reflection at 5.725keV. This results in an analyzed thickness of the sample surface of a few micrometers.

The surface was cleaned by ion bombardment. During annealing (T≅880K), we clearly observed the progressive disappearance of the initial Bragg peak characteristic of the as cast bulk sample. Conversely a new Bragg peak grows at an energy position shifted by 1eV compared to the position of the original Bragg peak. This is a clear signature for an irreversible structural transformation which takes place on at least the micron thickness. On the transformed surface, both, a LEED pattern and a RHEED pattern, characteristic for a five fold surface were easily obtained.

This high resolution experiment (the relative Bragg peak shift is 3ׁ10−4) was reproduced on samples from different initial compositions. This shows that five fold i-AlPdMn surface changes after preparation by ion bombardment and annealing at 900K on a micrometer thickness. This is not consistent with the conclusion that the surface is simply terminated by a cut of the original bulk. We conclude that a reorganization process of the quasicrystalline structure during annealing proceeds in the surface vicinity (probed depth is close to a few microns).

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This article is from MRS Proceedings 643 (2000): K11.4.1, doi:10.1557/PROC-643-K11.2 .

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Mon Jan 01 00:00:00 UTC 2001