Automated flaw detection method for X-ray images in nondestructive evaluation

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1992
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Ulmer, Karl
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Altmetrics
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Electrical and Computer Engineering
Abstract

Private, government and commercial sectors of the manufacturing world are plagued with imperfect materials, defective components, and aging assemblies that continuously infiltrate the products and services provided to the public. Increasing awareness of public safety and economic stability has caused the manufacturing world to search deeper for a solution to identify these mechanical weaknesses and thereby reduce their impact. The areas of digital image and signal processing have benefited greatly from the technological advances in computer hardware and software capabilities and the development of new processing methods resulting from extensive research in information theory, artificial intelligence, pattern recognition and related fields. These new processing methodologies and capabilities are laying a foundation of knowledge that empowers the industrial and academic community to boldly address this problem and begin designing and building better products and systems for tomorrow.

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Wed Jan 01 00:00:00 UTC 1992