Swept frequency eddy current (SFEC) measurements of Inconel 718 as a function of microstructure and residual stress

Thumbnail Image
Date
2013-01-01
Authors
Chandrasekar, Ramya
Major Professor
Advisor
L. Scott Chumbley
Committee Member
Journal Title
Journal ISSN
Volume Title
Publisher
Altmetrics
Authors
Research Projects
Organizational Units
Organizational Unit
Materials Science and Engineering
Materials engineers create new materials and improve existing materials. Everything is limited by the materials that are used to produce it. Materials engineers understand the relationship between the properties of a material and its internal structure — from the macro level down to the atomic level. The better the materials, the better the end result — it’s as simple as that.
Journal Issue
Is Version Of
Versions
Series
Department
Materials Science and Engineering
Abstract

The goal of this thesis was to determine the dependency of swept frequency eddy current (SFEC) measurements on the microstructure of the Ni-based alloy, Inconel 718 as a function of heat treatment and shot peening. This involved extensive characterization of the sample using SEM and TEM coupled with measurements and analysis of the eddy current response of the various sample conditions using SFEC data. Specific objectives included determining the eddy current response at varying depths within the sample, and this was accomplished by taking SFEC measurements in frequencies ranging from 100 kHz to 50 MHz. Conductivity profile fitting of the resulting SFEC signals was obtained by considering influencing factors (such as surface damage). The problems associated with surface roughness and near surface damage produced by shot peening were overcome by using an inversion model. Differences in signal were seen as a result of precipitation produced by heat treatment and by residual stresses induced due to the shot peening. Hardness of the material, which is related both to precipitation and shot peening, was seen to correlate with the measured SFEC signal. Surface stress measurement was carried out using XRD giving stress in the near surface regions, but not included in the calculations due to shallow depth information provided by the technique compared to SFEC. By comparing theoretical SFEC signal computed using the microstructural values (precipitate fraction) and experimental SFEC data, dependency of the SFEC signals on microstructure and residual stress was obtained.

Comments
Description
Keywords
Citation
Source
Subject Categories
Copyright
Tue Jan 01 00:00:00 UTC 2013