Multilevel sequence detection for dynamic mode atomic force microscopy
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The Department of Electrical and Computer Engineering (ECpE) contains two focuses. The focus on Electrical Engineering teaches students in the fields of control systems, electromagnetics and non-destructive evaluation, microelectronics, electric power & energy systems, and the like. The Computer Engineering focus teaches in the fields of software systems, embedded systems, networking, information security, computer architecture, etc.
History
The Department of Electrical Engineering was formed in 1909 from the division of the Department of Physics and Electrical Engineering. In 1985 its name changed to Department of Electrical Engineering and Computer Engineering. In 1995 it became the Department of Electrical and Computer Engineering.
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1909-present
Historical Names
- Department of Electrical Engineering (1909-1985)
- Department of Electrical Engineering and Computer Engineering (1985-1995)
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- College of Engineering (parent college)
- Department of Physics and Electrical Engineering (predecessor)
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Abstract
The atomic force microscope is an instrument that is widely used in fields such as biology, chemistry and medicine for imaging at the atomic level. In this work, we consider a specific mode of AFM usage, known as the dynamic mode where the AFM cantilever probe is forced sinusoidally. In the absence of interaction with the sample being imaged, the cantilever follows a predictable sinusoidal trajectory. The deflection of the cantilever probe changes when it interacts with the sample being imaged and imaging is performed by interpreting these changes.
In this work, we present a sequence detection based algorithm that allows for resolving topographic features into one of three possible levels at a fast speed. We demonstrate the effectiveness of our algorithm via simulation results and by comparing it to a lower bound that is obtained by considering a genie aided detector.