Elementary Statistical Methods and Measurement Error

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2010-01-01
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Vardeman, Stephen
Wendelberger, Joanne
Burr, Tom
Hamada, Michael
Moore, Leslie
Jobe, Marcus
Morris, Max
Wu, Huaiqing
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Vardeman, Stephen
University Professor Emeritus
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Statistics
As leaders in statistical research, collaboration, and education, the Department of Statistics at Iowa State University offers students an education like no other. We are committed to our mission of developing and applying statistical methods, and proud of our award-winning students and faculty.
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Industrial and Manufacturing Systems Engineering
The Department of Industrial and Manufacturing Systems Engineering teaches the design, analysis, and improvement of the systems and processes in manufacturing, consulting, and service industries by application of the principles of engineering. The Department of General Engineering was formed in 1929. In 1956 its name changed to Department of Industrial Engineering. In 1989 its name changed to the Department of Industrial and Manufacturing Systems Engineering.
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Abstract

How the sources of physical variation interact with a data collection plan determines what can be learned from the resulting dataset, and in particular, how measurement error is reflected in the dataset. The implications of this fact are rarely given much attention in most statistics courses. Even the most elementary statistical methods have their practical effectiveness limited by measurement variation; and understanding how measurement variation interacts with data collection and the methods is helpful in quantifying the nature of measurement error. We illustrate how simple one- and two-sample statistical methods can be effectively used in introducing important concepts of metrology and the implications of those concepts when drawing conclusions from data.

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This is an Accepted Manuscript of an article published by Taylor & Francis in The American Statistician on January 1, 2012, available online: http://www.tandfonline.com/10.1198/tast.2009.09079.

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Fri Jan 01 00:00:00 UTC 2010
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