Document Type

Conference Proceeding

Conference

Interferometry XVI: Techniques and Analysis

Publication Date

8-2012

DOI

10.1117/12.930376

City

San Diego, CA

Abstract

Often, the 3-D raw data coming from an optical profilometer contains spiky noises and irregular grid, which make it difficult to analyze and difficult to store because of the enormously large size. This paper is to address these two issues for an optical profilometer by substantially reducing the spiky noise of the 3-D raw data from an optical profilometer, and by rapidly re-sampling the raw data into regular grids at any pixel size and any orientation with advanced computer graphics tools. Experimental results will be presented to demonstrate the effectiveness of the proposed approach.

Comments

This is a conference proceeding from Interferometry XVI: Techniques and Analysis 8493 (2012): 1, doi:10.1117/12.930376. Posted with permission.

Copyright 2012 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic electronic or print reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.

Copyright Owner

Society of Photo-Optical Instrumentation Engineers

Language

en

Share

Article Location

 
COinS