Document Type

Conference Proceeding

Conference

Dimensional Optical Metrology and Inspection for Practical Applications II

Publication Date

8-2014

DOI

10.1117/12.2022226

City

San Diego, CA

Abstract

This paper presents a thorough comparison between a phase-based and an intensity-based optimization method for 3D shape measurement with the binary dithering techniques. Since for a 3D shape measurement system utilizing digital fringe projection techniques, the phase quality ultimately determines the measurement quality, and thus these two methods are compared in phase domain. Both simulation and experiments find that the phase-based optimization method can generate high-quality phase under given conditions. However, this method is sensitive to the amount of blurring (or defocusing). On contrast, the intensity-based optimization method can consistently generate high-quality phase with various amounts of defocusing. Both experiments and simulations will be presented to compare these two optimization methods

Comments

This is a conference proceeding from Dimensional Optical Metrology and Inspection for Practical Applications II 8839 (2013): 1, doi:10.1117/12.2022226. Posted with permission.

Copyright 2013 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic electronic or print reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.

Copyright Owner

Society of Photo-Optical Instrumentation Engineers

Language

en

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