Journal or Book Title
Applied Physics Letters
A control approach to achieve nanoscale broadband viscoelasticmeasurement using scanning probe microscope(SPM) is reported. Current SPM-based force measurement is too slow to measure rate-dependent phenomena, and large (temporal) measurement errors can be generated when the sample itself changes rapidly. The recently developed model-less inversion-based iterative control technique is used to eliminate the dynamics and hysteresis effects of the SPM hardware on the measurements, enabling rapid excitation and measurement of rate-dependent material properties. The approach is illustrated by the mechanical characterization of poly(dimethylsiloxane) over a broad frequency range of three orders of magnitude (∼1 Hz to 4.5 KHz).
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American Institute of Physics
Xu, Zhonghua; Kim, Kyongsoo; Zou, Qingze; and Shrotriya, Pranav, "Broadband measurement of rate-dependent viscoelasticity at nanoscale using scanning probe microscope: Poly(dimethylsiloxane) example" (2008). Mechanical Engineering Publications. 119.