Document Type

Article

Publication Date

9-29-2008

Journal or Book Title

Applied Physics Letters

Volume

93

Issue

133103

First Page

1

Last Page

3

DOI

10.1063/1.2990759

Abstract

A control approach to achieve nanoscale broadband viscoelasticmeasurement using scanning probe microscope(SPM) is reported. Current SPM-based force measurement is too slow to measure rate-dependent phenomena, and large (temporal) measurement errors can be generated when the sample itself changes rapidly. The recently developed model-less inversion-based iterative control technique is used to eliminate the dynamics and hysteresis effects of the SPM hardware on the measurements, enabling rapid excitation and measurement of rate-dependent material properties. The approach is illustrated by the mechanical characterization of poly(dimethylsiloxane) over a broad frequency range of three orders of magnitude (∼1 Hz to 4.5 KHz).

Comments

The following article appeared in Applied Physics Letters 93, 133103 (2008); and may be found at, doi:10.1063/1.2990759.

Rights

Copyright 2008 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

Copyright Owner

American Institute of Physics

Language

en

File Format

application/pdf