Document Type

Article

Publication Date

3-9-2012

Journal or Book Title

Optical Engineering

Volume

51

Issue

2

First Page

1

Last Page

6

DOI

10.1117/1.OE.51.2.023604

Abstract

Our study shows that the phase error caused by improperly defocused binary structured patterns correlates to the depth z. This finding leads to a novel uniaxial three-dimensional shape measurement technique without triangulation. Since the measurement can be performed from the same viewing angle, this proposed method overcomes some limitations of the triangulation-based techniques, such as the problem of measuring deep holes. Our study explains the principle of the technique and presents some experimental results to verify its feasibility.

Comments

This article is from Optical Engineering 51 (2012): 1, doi:10.1117/1.OE.51.2.023604. Posted with permission.

Rights

Copyright 2011 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic electronic or print reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.

Copyright Owner

Society of Photo-Optical Instrumentation Engineers

Language

en

File Format

application/pdf

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