Document Type

Article

Publication Date

2010

Journal or Book Title

Optics Express

Volume

18

Issue

9

First Page

9684

Last Page

9689

DOI

10.1364/OE.18.009684

Abstract

Recently introduced DLP Discovery technology allows for tens of kHz binary image switching, which has great potential for superfast 3-D shape measurement. This paper presents a system that realizes 3-D shape measurement by using a DLP Discovery technology to switch binary structured patterns at very high frame rates. The sinusoidal fringe patterns are generated by properly defocusing the projector. Combining this approach with a phase-shifting method, we achieve an unprecedented rate for 3-D shape measurement: 667 Hz. This technology can be applied to numerous applications including medical science, biometrics, and entertainment.

Comments

This paper was published in Optics Express and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://dx.doi.org/10.1364/OE.18.009684. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.

Copyright Owner

OSA

Language

en

File Format

application/pdf

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