Document Type

Article

Publication Date

1-3-2014

Journal or Book Title

Optical Engineering

Volume

53

Issue

14

First Page

014102

DOI

10.1117/1.OE.53.1.014102

Abstract

Single reference-phase-based methods have been extensively utilized in digital fringe projection systems, yet they might not provide the maximum sensitivity given a hardware system configuration. This paper presents an innovative method to improve the measurement quality by utilizing two orthogonal phase maps. Specifically, two reference phase maps generated from horizontal and vertical (i.e., orthogonal) fringe patterns projected are combined into a vector reference phase map through a linear combination for depth extraction. The experiments have been conducted to verify the superiority of the proposed method over a conventional single reference-phase-based approach.

Comments

This article is from Optical Engineering 53 (2014): 014102, doi:10.1117/1.OE.53.1.014102. Posted with permission.

Rights

Copyright 2014 Society of Photo Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.

Copyright Owner

SPIE

Language

en

File Format

application/pdf

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