High-resolution 3D profilometry with binary phase-shifting methods
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2011-04-20
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Zhang, Song
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Mechanical Engineering
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Mechanical Engineering
Abstract
This paper presents a novel pixel-level resolution 3D profilometry technique that only needs binary phase-shifted structured patterns. This technique uses four sets of three phase-shifted binary patterns to achieve the phase error of less than 0.2%, and only requires two sets to reach similar quality if the projector is slightly defocused. Theoretical analysis, simulations, and experiments will be presented to verify the performance of the proposed technique.
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This article is from Applied Optics 50 (2011): 1753–1757, doi:10.1364/AO.50.001753. Posted with permission.
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Sat Jan 01 00:00:00 UTC 2011