Document Type

Article

Publication Date

4-20-2011

Journal or Book Title

Applied Optics

Volume

50

Issue

12

First Page

1753

Last Page

1757

DOI

10.1364/AO.50.001753

Abstract

This paper presents a novel pixel-level resolution 3D profilometry technique that only needs binary phase-shifted structured patterns. This technique uses four sets of three phase-shifted binary patterns to achieve the phase error of less than 0.2%, and only requires two sets to reach similar quality if the projector is slightly defocused. Theoretical analysis, simulations, and experiments will be presented to verify the performance of the proposed technique.

Comments

This article is from Applied Optics 50 (2011): 1753–1757, doi:10.1364/AO.50.001753. Posted with permission.

Rights

This paper was published in Applied Optics and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://dx.doi.org/10.1364/AO.50.001753. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.

Copyright Owner

Optical Society of America

Language

en

File Format

application/pdf

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