Document Type

Article

Publication Date

9-20-2012

Journal or Book Title

Applied Optics

Volume

51

Issue

27

First Page

6631

Last Page

6636

DOI

10.1364/AO.51.006631

Abstract

The previously proposed binary defocusing technique and its variations have proven successful for high-quality three-dimensional (3D) shape measurement when fringe stripes are relatively narrow, but they suffer if fringe stripes are wide. This paper proposes to utilize the binary dithering technique to conquer this challenge. Both simulation and experimental results show the phase error is always less than 0.6% even when the fringe stripes are wide and the projector is nearly focused.

Comments

This article is from Applied Optics 51 (2012): 6631–6636, doi:10.1364/AO.51.006631. Posted with permission.

Rights

This paper was published in Applied Optics and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://dx.doi.org/10.1364/AO.51.006631. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.

Copyright Owner

Optical Society of America

Language

en

File Format

application/pdf

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