Document Type

Article

Publication Date

2-15-2013

Journal or Book Title

Optics Letters

Volume

38

Issue

4

First Page

540

Last Page

42

DOI

10.1364/OL.38.000540

Abstract

The recently proposed dithering techniques could substantially improve measurement quality when fringes are wide, but offer limited improvement when fringes are narrow. This Letter presents a genetic algorithm to optimize the dithering technique for sinusoidal structured pattern representation. We believe both simulation and experimental results show that this proposed algorithm can substantially improve fringe quality for both narrow and wide fringe patterns.

Comments

This article is from Optics Letters 38 (2013): 540–42, doi:10.1364/OL.38.000540. Posted with permission.

Rights

This paper was published in Optics Letters and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://dx.doi.org/10.1364/OL.38.000540. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.

Copyright Owner

Optical Society of America

Language

en

File Format

application/pdf

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