Document Type

Article

Publication Date

9-13-2010

Journal or Book Title

Optics Express

Volume

18

Issue

19

First Page

19743

Last Page

19754

DOI

10.1364/OE.18.019743

Abstract

This paper presents a technique that reaches 3-D shape measurement speed beyond the digital-light-processing (DLP) projector’s projection speed. In particular, a “solid-state” binary structured pattern is generated with each micro-mirror pixel always being at one status (ON or OFF). By this means, any time segment of projection can represent the whole signal, thus the exposure time can be shorter than the projection time. A sinusoidal fringe pattern is generated by properly defocusing a binary one, and the Fourier fringe analysis means is used for 3-D shape recovery. We have successfully reached 4,000 Hz rate (80 µs exposure time) 3-D shape measurement speed with an off-the-shelf DLP projector.

Comments

This article is from Optics Express 18 (2010): 19743–19754, doi:10.1364/OE.18.019743. Posted with permission.

Rights

This paper was published in Optics Express and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://dx.doi.org/10.1364/OE.18.019743. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.

Copyright Owner

Optical Society of America

Language

en

File Format

application/pdf

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