Document Type

Article

Publication Date

11-2-2012

Journal or Book Title

Optical Engineering

Volume

51

Issue

11

First Page

113602

DOI

10.1117/1.OE.51.11.113602

Abstract

A recent study found that it is very difficult to use the squared binary defocusing technique to eliminate the influence of third-order harmonics without compromising fringe quality, and thus it is challenging to utilize Fourier transform profilometry to achieve high-quality three-dimensional measurement. A novel approach is presented to effectively eliminate the third-order harmonics by modulating the squared binary structured patterns. Both simulation and experiments are presented to verify the performance of the proposed technique.

Comments

This article is from Optical Engineering 51 (2012): 113602, doi:10.1117/1.OE.51.11.113602.

Rights

Copyright 2012 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.

Copyright Owner

SPIE

Language

en

File Format

application/pdf

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