Document Type

Patent

Publication Date

12-24-1991

Abstract

A method and apparatus for enabling analysis of a solid material (16, 42) by applying energy from an energy source (20, 70) top a surface region of the solid material sufficient to cause transient heating in a thin surface layer portion of the solid material (16, 42) so as to enable transient thermal emission of infrared radiation from the thin surface layer portion, and by detecting with a spectrometer/detector (28, 58) substantially only the transient thermal emission of infrared radiation from the thin surface layer portion of the solid material. The detected transient thermal emission of infrared radiation is sufficiently free of self-absorption by the solid material of emitted infrared radiation, so as to be indicative of characteristics relating to molecular composition of the solid material.

Patent Number

US 5,075,552

ISURF Reference Number

1025

Assignee

Iowa State University Research Foundation, Inc.,

Application Number

US 07/576,448

Date Filed

1-12-1990

Language

en

File Format

application/pdf

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