Presenter Information

K. C. Tam, General Electric

Location

Williamsburg, VA

Start Date

1-1-1986 12:00 AM

Description

The 3-dimensional Born approximation is a powerful method for characterizing flaws because it can be applied to characterize flaws of any shape. Yet, the method has a number of difficulties, such as taking and processing a large amount of data, and the complications associated with 3-dimensional image reconstructions such as 3-dimensional interpolation, long computing time, etc. For these reasons the method is usually simplified and restricted to characterize symmetrically shaped flaws, which can be characterized by using only a small number of pulse echoes. Though this procedure is simple, it cannot be applied to characterize flaws of more general shape.

Book Title

Review of Progress in Quantitative Nondestructive Evaluation

Volume

5A

Chapter

Chapter 2: Inversion, Imaging and Reconstruction

Section

Imaging and Reconstruction

Pages

541-553

DOI

10.1007/978-1-4615-7763-8_56

Language

en

File Format

application/pdf

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Jan 1st, 12:00 AM

3-Dimensional Flaw Characterization Through 2-Dimensional Image Reconstructions

Williamsburg, VA

The 3-dimensional Born approximation is a powerful method for characterizing flaws because it can be applied to characterize flaws of any shape. Yet, the method has a number of difficulties, such as taking and processing a large amount of data, and the complications associated with 3-dimensional image reconstructions such as 3-dimensional interpolation, long computing time, etc. For these reasons the method is usually simplified and restricted to characterize symmetrically shaped flaws, which can be characterized by using only a small number of pulse echoes. Though this procedure is simple, it cannot be applied to characterize flaws of more general shape.