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Submissions from 2015

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Estimating standard errors for importance sampling estimators with multiple Markov chains, Vivekananda Roy, Aixin Tan, and James M. Flegal

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A Multi-level Trend-Renewal Process for Modeling Systems with Recurrence Data, Zhibing Xu, Yili Hong, William Q. Meeker, Brock E. Osborn, and Kati Illouz

Submissions from 2014

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Generalized Method of Moments Estimator Based On Semiparametric Quantile Regression Imputation, Senniang Chen and Cindy L. Yu

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Bayesian Life Test Planning for the Log-Location-Scale Family of Distributions, Yili Hong, Caleb King, Yao Zhang, and William Q. Meeker

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Product Component Genealogy Modeling and Field-Failure Prediction, Caleb King, Yili Hong, and William Q. Meeker

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The Number of MCMC Draws Needed to Compute Bayesian Credible Bounds, Jia Liu, Daniel J. Nordman, and William Q. Meeker

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Using Degradation Models to Assess Pipeline Life, Shiyao Liu and William Q. Meeker

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Simultaneous Prediction Intervals for the (Log)-Location-Scale Family of Distributions, Yimeng Xie, Yili Hong, Luis A. Escobar, and William Q. Meeker

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On the Residual Lifetime of Surviving Components from a Failed Coherent Systems, Zhengcheng Zhang and William Q. Meeker

Submissions from 2013

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Application of Bayesian Methods in Reliability Data Analyses, Ming Li and William Q. Meeker

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Statistical Methods for Estimating the Minimum Thickness Along a Pipeline, Shiyao Liu and William Q. Meeker

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Understanding and Addressing the Unbounded “Likelihood” Problem, Shiyao Liu, Huaiqing Wu, and William Q. Meeker

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Reliability Meets Big Data: Opportunities and Challenges, William Q. Meeker and Yili Hong

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Methods For Planning Accelerated Repeated Measures Degradation Tests, Brian Phillip Weaver and William Q. Meeker

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Assessing Risk of a Serious Failure Mode Based on Limited Field Data, Zhibing Xu, Yili Hong, and William Q. Meeker

Submissions from 2012

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Statistical Methods for Degradation Data with Dynamic Covariates Information and an Application to Outdoor Weathering Data, Yili Hong, Yuanyuan Duan, William Q. Meeker, Deborah L. Stanley, and Xiaohong Gu

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Mixture Representations of Reliability in Coherent Systems and Preservation Results under Double Monitoring, Zhengcheng Zhang and William Q. Meeker

Submissions from 2011

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Coverage Probabilities of Simultaneous Confidence Bands and Regions for Log-Location-Scale Distributions, Yili Hong, Luis A. Escobar, and William Q. Meeker

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Field Failure Prediction Using Dynamic Environmental Data, Yili Hong and William Q. Meeker

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Quantitative Multi-Inspection-Site Comparison of Probability of Detection for Vibrothermography Nondestructive Evaluation Data, Ming Li, Stephen D. Holland, and William Q. Meeker

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Physical Model Assisted Probability of Detection in Nondestructive Evaluation for Detecting of Flaws in Titanium Forgings, Ming Li, William Q. Meeker, and R. Bruce Thompson

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Statistical Assessment of Probability of Detection for Automated Eddy Current Nondestructive Evaluation Inspection, Ming Li, Norio Nakagawa, Brian F. Larson, and William Q. Meeker

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Methods For Planning Repeated Measures Degradation Studies, Brian Phillip Weaver, William Q. Meeker, Luis A. Escobar, and Joanne Wendelberger

Submissions from 2010

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A Statistical Method for Crack Detection from Vibrothermography Inspection Data, Chunwang Gao and William Q. Meeker

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A Comparison of Maximum Likelihood and Median Rank Regression for Weibull Estimation, Ulrike Genschel and William Q. Meeker

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Bayesian Methods for Estimating the Reliability of Complex Systems Using Heterogeneous Multilevel Information, Jiqiang Guo and Alyson G. Wilson

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A Tool for Evaluating Time-Varying-Stress Accelerated Life Test Plans with Log-Location-Scale Distributions, Yili Hong, Haiming Ma, and William Q. Meeker

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Accelerated Destructive Degradation Tests Robust to Distribution Misspecification, Shuen-Lin Jeng, Bei-Ying Huang, and William Q. Meeker

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Statistical Methods for Automatic Crack Detection Based on Vibrothermography Sequence-of-Images Data, Ming Li, Stephen D. Holland, and William Q. Meeker

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Bayesian Methods for Accelerated Destructive Degradation Test Planning, Ying Shi and William Q. Meeker

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Planning Accelerated Destructive Degradation Test with Competing Risks, Ying Shi and William Q. Meeker

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A Simulation Study on Confidence Interval Procedures of Some Mean Cumulative Function Estimators, Jianying Zuo, William Q. Meeker, and Huaiqing Wu

Submissions from 2009

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Warranty Prediction Based on Auxiliary Use-rate Information, Yili Hong and William Q. Meeker

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A Hidden Markov Model Approach to Testing Multiple Hypotheses on a Gene Ontology Graph, Kun Liang and Dan Nettleton

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Strategy for Planning Accelerated Life Tests with Small Sample Sizes, Haiming Ma and William Q. Meeker

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Trends in the Statistical Assessment of Reliability, William Q. Meeker

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Testing for the Supremacy of a Multinomial Cell Probability, Dan Nettleton

Submissions from 2008

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Simultaneous Confidence Bands and Regions for Log-Location-Scale Distributions with Censored Data, Luis A. Escobar, Yili Hong, and William Q. Meeker

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Linking Accelerating Laboratory Test with Outdoor Performance Results for a Model Epoxy Coating System, Xiaohong Gu, Brian Dickens, Debbie Stanley, Walter E. Byrd, Tinh Nguyen, Iliana Vaca-Trigo, William Q. Meeker, Joannie Chin, and Jonathan W. Martin

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The importance of identifying different components of a mixture distribution in the prediction of field returns, Yili Hong and William Q. Meeker

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The Relationship Between Confidence Intervals for Failure Probabilities and Life Time Quantiles, Yili Hong, William Q. Meeker, and Luis A. Escobar

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Prediction of remaining life of power transformers based on left truncated and right censored lifetime data, Yili Hong, William Q. Meeker, and James D. McCalley

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Using Accelerated Life Tests Results to Predict Product Field Reliability, William Q. Meeker, Luis A. Escobar, and Yili Hong

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Accelerated Destructive Degradation Test Planning, Ying Shi, Luis A. Escobar, and William Q. Meeker

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A Statistical Model for Linking Field and Laboratory Exposure Results for a Model Coating, Iliana Vaca-Trigo and William Q. Meeker

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Fractional Factorial Designs with Admissible Sets of Clear Two-Factor Interactions, Huaiqing Wu, Robert Mee, and Boxin Tang

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A calibration experiment in a longitudinal survey with errors-in-variables, Cindy L. Yu and Jason Colin Legg

Submissions from 2007

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Optimal Tests Shrinking Both Means and Variances Applicable to Microarray Data Analysis, J.T. Gene Hwang and Peng Liu

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Statistical Dependence in Markov Random Field Models, Mark S. Kaiser

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Exploring Dependence with Data on Spatial Lattices, Mark S. Kaiser and Petruta C. Caragea

Submissions from 2006

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Parameters Estimation and Bias Correction for Diffusion Processes, Song Xi Chen and Cheng Yong Tang

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A goodness-of-fit test for parametric and semi-parametric models in multiresponse regression, Song Xi Chen and Ingrid Van Keilegom

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Smoothed Block Empirical Likelihood for Quantiles of Weakly Dependent Processes, Song Xi Chen and Chiu Min Wong

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A Review of Accelerated Test Models, Luis A. Escobar and William Q. Meeker

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Data augmentation for a Bayesian spatial model involving censored observations, Brooke L. Fridley and Philip M. Dixon

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Normal Approximations for Computing Confidence Intervals for Log-Location-Scale Distribution Probabilities, Yili Hong, William Q. Meeker, and Luis A. Escobar

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A Bayesian Analysis of Return Dynamics with Stochastic Volatility and Levy Jumps, Haitao Li, Matin T. Wells, and Cindy L. Yu

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Quick Calculation for Sample Size while Controlling False Discovery Rate with Application to Microarray Analysis, Peng Liu and J.T. Gene Hwang

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Return Dynamics with Levy Jumps: Evidence from Stock and Option Prices, Cindy L. Yu, Haitao Li, and Martin T. Wells

Submissions from 2005

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Nonparametric estimation of copula functions for dependence modelling, Song Xi Chen and Tzeeming Huang

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Exploring the Information in P-values, David Ruppert, Dan Nettleton, and J.T. Gene Hwang

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Nonparametric Imputation of Missing Values for Estimating Equation Based Inference, Dong Wang and Song Xi Chen

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Nonparametric Imputation of Missing Values for Estimating Equation Based Inference, Dong Wang and Song Xi Chen

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Analysis of Window-Observation Recurrence Data, Jianying Zuo, William Q. Meeker, and Huaiqing Wu

Submissions from 2004

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Nonparametric Estimation of Expected Shortfall, Song Xi Chen

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On the Second Order Properties of Empirical Likelihood with Moment Restrictions1, Song Xi Chen and Hengjian Cui

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An Adaptive Empirical Likelihood Test for Parametric Time Series Regression Models, Song Xi Chen and Jiti Gao

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Nonparametric Inference of Value at Risk for Dependent Financial Returns, Song Xi Chen and Cheng Yong Tang

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Gene expression patterns during somatic embryo development and germination in maize Hi II cultures, Ping Che, Tanzy Mae Love, Bronwyn R. Frame, Kan Wang, Alicia L. Carriquiry, and Stephen H. Howell

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Identifying Differentially Expressed Genes in Unreplicated Multiple-Treatment Microarray Timecourse Experiments, Rhonda DeCook, Dan Nettleton, Carol Foster, and Eve S. Wurtele

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Regression Analysis with Linked Data, P. Lahiri and Michael D. Larsen

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A Sub-Gaussian Berry-Esseen Theorem For the Hypergeometric Distribution, Soumendra N. Lahiri, Arindam Chatterjee, and Tapabrata Maiti

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Incorporating Multiple cDNA Microarray Slide Scans -Application to Somatic Embryogenesis in Maize, Tanzy Love and Alicia L. Carriquiry

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Combining nearest neighbor classifiers versus cross-validation selection, Minhui Paik and Yuhong Yang

Submissions from 2003

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Block Bootstrap Estimation of the Distribution of Cumulative Outdoor Degradation, Victor Chan, Soumendra N. Lahiri, and William Q. Meeker

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Accelerated Destructive Degradation Tests: Data, Models, and Analysis, Luis A. Escobar, William Q. Meeker, Danny L. Kugler, and Laura L. Kramer

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Conditional Covariance Based Subtest Selection for DIMTEST, Amy G. Froelich and Brian Habing

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Asymptotic Properties of Bootstrap Likelihood Ratio Statistics for Time Censored Data, Shuen-Lin Jeng, Soumendra N. Lahiri, and William Q. Meeker

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Reliability: The Other Dimension of Quality, William Q. Meeker and Luis A. Escobar

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Can the strengths of AIC and BIC be shared?, Yuhong Yang

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Combining linear regression models: When and how?, Zheng Yuan and Yuhong Yang

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Bayesian Optimum Planning for Accelerated Life Tests, Yao Zhang and William Q. Meeker

Submissions from 2002

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Model combining in factorial data analysis, Lihua Chen and Yuhong Yang

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Time series models for forecasting: Testing or combining?, Zhuo Chen and Yuhong Yang

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In the Garden of Branching Processes, Karin S. Dorman, Janet S. Sinsheimer, and Kenneth Lange

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Likelihood-Based Inference in Some Continuous Exponential Families With Unknown Threshold, Thomas Michael Dubinin and Stephen B. Vardeman

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An Analysis of Grain Production Decline During the Early Transition in Ukraine: Bayesian Inference, Lyubov A. Kurkalova and Alicia L. Carriquiry

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Sample Size and Number of Failure Requirements for Demonstration Tests with Log-Location-Scale Distributions and Type II Censoring, Scott W. McKane, Luis A. Escobar, and William Q. Meeker

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Survey Methods for Assessing Land Cover Map Accuracy, Sarah M. Nusser and Erwin E. Klaas

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Geospatial Information Technologies for Mobile Field Data Collection, Sarah M. Nusser, Leslie Miller, Keith Clarke, and Michael Goodchild

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Development Programs for One-Shot Systems Using Multiple-State Design Reliability Models, Suntichai Shevasuthisilp and Stephen B. Vardeman

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Bayesian Life Test Planning for the Weibull Distribution with Given Shape Parameter, Yao Zhang and William Q. Meeker

Submissions from 2001

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Estimation of Degradation-Based Reliability in Outdoor Environments, Victor Chan and William Q. Meeker

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Nearest Neighbor Methods, Philip M. Dixon

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Population Ecology, Philip M. Dixon

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Ripley’s K function, Philip M. Dixon

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The Bootstrap, Philip M. Dixon

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Software for Reliability Data Analysis and Test Planning, William Q. Meeker and Luis A. Escobar

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Use of Sensitivity Analysis to Assess the Effect of Model Uncertainty in Analyzing Accelerated Life Test Data, William Q. Meeker and Luis A. Escobar

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Use of Truncated Regression Methods to Estimate the Shelf Life of a Product from Incomplete Historical Data, William Q. Meeker and Luis A. Escobar