Campus Units
Agronomy
Document Type
Article
Publication Version
Published Version
Publication Date
4-8-2020
Journal or Book Title
PLoS ONE
Volume
15
Issue
4
First Page
e0230855
DOI
10.1371/journal.pone.0230855
Abstract
Growing resistant wheat (Triticum aestivum L) varieties is an important strategy for the control of leaf rust, caused by Puccinia triticina Eriks. This study sought to identify the chromosomal location and effects of leaf rust resistance loci in five Canadian spring wheat cultivars. The parents and doubled haploid lines of crosses Carberry/AC Cadillac, Carberry/Vesper, Vesper/Lillian, Vesper/Stettler and Stettler/Red Fife were assessed for leaf rust severity and infection response in field nurseries in Canada near Swift Current, SK from 2013 to 2015, Morden, MB from 2015 to 2017 and Brandon, MB in 2016, and in New Zealand near Lincoln in 2014. The populations were genotyped with the 90K Infinium iSelect assay and quantitative trait loci (QTL) analysis was performed. A high density consensus map generated based on 14 doubled haploid populations and integrating SNP and SSR markers was used to compare QTL identified in different populations. AC Cadillac contributed QTL on chromosomes 2A, 3B and 7B (2 loci), Carberry on 1A, 2B (2 loci), 2D, 4B (2 loci), 5A, 6A, 7A and 7D, Lillian on 4A and 7D, Stettler on 2D and 6B, Vesper on 1B, 1D, 2A, 6B and 7B (2 loci), and Red Fife on 7A and 7B. Lillian contributed to a novel locus QLr.spa-4A, and similarly Carberry at QLr.spa-5A. The discovery of novel leaf rust resistance QTL QLr.spa-4A and QLr.spa-5A, and several others in contemporary Canada Western Red Spring wheat varieties is a tremendous addition to our present knowledge of resistance gene deployment in breeding. Carberry demonstrated substantial stacking of genes which could be supplemented with the genes identified in other cultivars with the expectation of increasing efficacy of resistance to leaf rust and longevity with little risk of linkage drag.
Rights
This is an open access article, free of all copyright, and may be freely reproduced, distributed, transmitted, modified, built upon, or otherwise used by anyone for any lawful purpose. The work is made available under the Creative Commons CC0 public domain dedication.
Language
en
File Format
application/pdf
Recommended Citation
Bokore, Firdissa E.; Knox, Ron E.; Cuthbert, Richard D.; Pozniak, Curtis J.; McCallum, Brent D.; N’Diaye, Amidou; DePauw, Ron M.; Campbell, Heather L.; Munro, Catherine; Singh, Arti; Hiebert, Colin W.; McCartney, Curt A.; Sharpe, Andrew G.; Singh, Asheesh K.; Spaner, Dean; Fowler, D. B.; Ruan, Yuefeng; Berraies, Samia; and Meyer, Brad, "Mapping quantitative trait loci associated with leaf rust resistance in five spring wheat populations using single nucleotide polymorphism markers" (2020). Agronomy Publications. 650.
https://lib.dr.iastate.edu/agron_pubs/650
Included in
Agriculture Commons, Agronomy and Crop Sciences Commons, Plant Breeding and Genetics Commons, Plant Pathology Commons
Comments
This article is published as Bokore FE, Knox RE, Cuthbert RD, Pozniak CJ, McCallum BD, N’Diaye A, et al. (2020) Mapping quantitative trait loci associated with leaf rust resistance in five spring wheat populations using single nucleotide polymorphism markers. PLoS ONE 15(4): e0230855. doi: 10.1371/journal.pone.0230855.