Document Type
Conference Proceeding
Conference
Fourier Transform Spectroscopy: Eleventh International Conference
Publication Date
8-1997
DOI
10.1063/1.55710
City
Athens, Georgia
Abstract
In the forest products industry, improved methods are needed for rapid analysis of wood and paper products. Currently, the best methods for determining chemical and physical properties of wood-based materials require considerable sample preparation and analysis time. Consequently, quantitative information is often not obtained on a time scale suitable for process monitoring, control, and quality assurance. The primary barriers to practical utilization of conventional infrared methods are the opaqueness and poor reflection properties of the wood-based materials. This paper demonstrates how photoacoustic and transient infrared spectroscopies have been combined with chemometric techniques to overcome the limitations of conventional infrared spectroscopies and to permit rapid chemical and physical characterization of wood chips. Both photoacoustic and transient infrared spectroscopic methods are examined as rapid at- and on-line techniques for feedstock identification and chemical composition analysis prior to processing.
Copyright Owner
American Institute of Physics
Copyright Date
1998
Language
en
Recommended Citation
Bajic, Stanley J.; Jones, Roger W.; McClelland, John F.; Hames, Bonnie R.; and Meglen, Robert R., "Rapid Analysis of Wood Using Transient Infrared Spectroscopy and Photoacoustic Spectroscopy with PLS Regression" (1997). Ames Laboratory Conference Papers, Posters, and Presentations. 82.
https://lib.dr.iastate.edu/ameslab_conf/82
Included in
Acoustics, Dynamics, and Controls Commons, Biochemistry Commons, Wood Science and Pulp, Paper Technology Commons
Comments
The following article appeared in AIP Conference Proceedings 430 (1998): 466 and may be found at doi:10.1063/1.55710.
Copyright (1998) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.