The effect of edge dislocations, impinging on grain boundary in fcc Fe near a preexisting void on the volume of this void, was studied using MD simulation. It was found that virtually unlimited growth of the void via this mechanism is possible under certain conditions. To the best of our knowledge this is the first atomistic simulation study, demonstrating feasibility of this void growth mechanism.
DOE Contract Number(s)
AC02-07CH11358; FWP AL-17-510091
Iowa State University Digital Repository, Ames IA (United States)
Available for download on Friday, February 18, 2022