Document Type

Article

Publication Date

1-9-2006

Journal or Book Title

Physical Review B

Volume

73

Issue

3

First Page

035110

DOI

10.1103/PhysRevB.73.035110

Abstract

The complex dielectric functions of single crystals of Gd5Si2Ge2 were obtained using spectroscopic ellipsometry (SE) in the photon energy range of 1.5–5.0 eV at room temperature. Reflectance difference (RD) spectra for the a‐b and b‐c planes of single crystals of Gd5Si2Ge2 were derived from these dielectric functions and compared to those obtained from reflectance difference spectroscopy (RDS) at near-normal incidence. The two experimental RD spectra from SE and RDS agreed well. The in-plane optical anisotropy of the sample is mainly due to intrinsic bulk properties because of its larger magnitude (4×10−2) compared to surface-induced optical anisotropies, with a magnitude of only about 10−3 for a typical cubic material.

Comments

This article is from Physical Review B 73 (2006): 035110, doi:10.1103/PhysRevB.73.035110.

Copyright Owner

American Physical Society

Language

en

File Format

application/pdf

Share

COinS