Document Type

Article

Publication Date

5-28-2002

Journal or Book Title

Physical Review B

Volume

65

Issue

24

First Page

245405

DOI

10.1103/PhysRevB.65.245405

Abstract

Morphology of the fivefold symmetric quasicrystal surface of AlPdMn was investigated by x-ray reflectivity and by x-ray diffraction. X-ray experiments revealed two different morphologies depending on the surface preparation. Sputtering and annealing up to 900 K, under UHV conditions, produced a rough and facetted quasicrystal surface. These features were confirmed by atomic force microscopy and scanning tunnel microscopy measurements. We also observed that an annealing above 900 K induces a rapid and irreversible transition toward a flat surface.

Comments

This article is from Physical Review B 65 (2002): 245405, doi:10.1103/PhysRevB.65.245405.

Copyright Owner

American Physical Society

Language

en

File Format

application/pdf

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