Document Type

Article

Publication Date

7-14-2005

Journal or Book Title

Physical Review B

Volume

72

Issue

4

First Page

045428

DOI

10.1103/PhysRevB.72.045428

Abstract

We investigate a thin Sn film grown at elevated temperatures on the fivefold surface of an icosahedral AlCuFe quasicrystal by scanning tunneling microscopy (STM). At about one monolayer coverage, the deposited Sn is found to form a smooth film of height consistent with one-half of the lattice constant of the bulk Sn. Analysis based on the Fourier transform and autocorrelation function derived from high-resolution STM images reveals that Sn grows pseudomorphically and hence exhibits a quasicrystalline structure.

Comments

This article is from Physical Review B 72 (2005): 045428, doi:10.1103/PhysRevB.72.045428.

Copyright Owner

American Physical Society

Language

en

File Format

application/pdf

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