Ultrasonic flaw sizing—An overview
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2012-07-01
Authors
Schmerr, Lester
Engle, Brady
Sedov, Alexander
Li, Xiongbing
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Center for Nondestructive Evaluation
Abstract
The time-of-flight diffraction (TOFD) technique is one of the most common sizing methods in practical use by industry today. This method was developed over 40 years ago and is based on the technology and state of knowledge present at that time. A combination of phased arrays and equivalent flaw sizing methods are proposed as the foundation for a new generation of sizing methods that go beyond TOFD sizing.
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Copyright 2013 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
This article appeared in AIP Conference Proceedings 1511 (2012): 1817–1824 and may be found at http://dx.doi.org/10.1063/1.4789261.
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Tue Jan 01 00:00:00 UTC 2013