NDE technology encompasses a broad field of applications [1] such as material selection, properties characterization, defect detection, damage assessment, process monitoring, in-service sensing, etc. However, the most common application of NDE, for hardware manufacturers, remains in quality assurance of products at various check points. In such operations, process engineers and customers demand well archived inspection procedures and test records for future reference. Although inspection reports may serve this purpose, imaging techniques that directly correlate measured NDE parameters with specimen coordinates are the preferred methods for inspection and data presentation.