Error Arising from Original Approximation in Photothermal Measurement of Weak Absorption of Optical Thin Film
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Begun in 1973, the Review of Progress in Quantitative Nondestructive Evaluation (QNDE) is the premier international NDE meeting designed to provide an interface between research and early engineering through the presentation of current ideas and results focused on facilitating a rapid transfer to engineering development.
This site provides free, public access to papers presented at the annual QNDE conference between 1983 and 1999, and abstracts for papers presented at the conference since 2001.
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Abstract
The technique of photothermal deflection spectroscopy (PTDS) for absorption measurement of optical thin film is simple in installation and fast in detection. However, while measurable absorbance reaches the order of magnitude of 10-7, e.g. in studies of optical thin film and investigation of laser damage mechanisms [1,2], we are still doubtful of its precision because of the lack of independent evaluation with available instruments whose precision could reach this lower limit. This work aims at giving a theoretical investigation on the source of error in order to obtain a realistic estimate of measurement error and hence to find optimal way to minimize measurement error in applying PTDS to optical thin film.