Characterizing Electric Field Exposed P3HT Thin Films Using Polarized‐Light Spectroscopies

Thumbnail Image
Supplemental Files
Date
2016-08-01
Authors
Elshobaki, Moneim
Santra, Kalyan
Bobbitt, Jonathan
Chaudhary, Sumit
Petrich, Jacob
Major Professor
Advisor
Committee Member
Journal Title
Journal ISSN
Volume Title
Publisher
Authors
Person
Smith, Emily
Professor
Person
Petrich, Jacob
Professor
Research Projects
Organizational Units
Organizational Unit
Organizational Unit
Materials Science and Engineering
Materials engineers create new materials and improve existing materials. Everything is limited by the materials that are used to produce it. Materials engineers understand the relationship between the properties of a material and its internal structure — from the macro level down to the atomic level. The better the materials, the better the end result — it’s as simple as that.
Organizational Unit
Journal Issue
Is Version Of
Versions
Series
Department
Ames National LaboratoryMaterials Science and EngineeringChemistry
Abstract

P3HT (poly (3‐hexylthiophene)) has been widely used as a donor in the active layer in organic photovoltaic devices. Although moderately high‐power conversion efficiencies have been achieved with P3HT‐based devices, structural details, such as the orientation of polymer units and the extent of H‐ and J‐aggregation are not yet fully understood; and different measures have been taken to control the ordering in the material. One such measure, which has been exploited, is to apply an electric field from a Van de Graaff generator. Fluorescence (to measure anisotropy instead of polarization, which is more commonly measured) and Raman spectroscopy are used to characterize the order of P3HT molecules in thin films resulting from the field. Preferential orientations of the units in a thin film are determined, consistent with observed hole mobility in thin‐film transistors, and it is observed that the apparent H‐coupling strength changes when the films are exposed to oriented electrical fields during drying.

Comments

This is the peer-reviewed version of the following article: Bhattacharjee, Ujjal, Moneim Elshobaki, Kalyan Santra, Jonathan M. Bobbitt, Sumit Chaudhary, Emily A. Smith, and Jacob W. Petrich. "Characterizing Electric Field Exposed P3HT Thin Films Using Polarized‐Light Spectroscopies." Macromolecular Chemistry and Physics 217, no. 16 (2016): 1801-1809 which has been published in final form at doi: 10.1002/macp.201600113. This article may be used for non-commercial purposes in accordance with Wiley Terms and Conditions for Self-Archiving. Posted with permission.

Description
Keywords
Citation
DOI
Copyright
Fri Jan 01 00:00:00 UTC 2016
Collections