Document Type

Article

Publication Date

2003

Journal or Book Title

Physical Review B

Volume

67

Issue

15

First Page

155401

DOI

10.1103/PhysRevB.67.155401

Abstract

We demonstrate the influence of interfacial strain on the growth modes of Ag films on Al(111), despite the small magnitude of the lattice misfit in this system. The strain is relieved by the formation of stacking fault domains bounded by Shockley partial dislocations. The growth mode and the step roughness appear to be strongly connected. Growth is three-dimensional (3D) as long as the steps are straight, but switches to 2D at higher coverage when the steps become rough. Anisotropic strain relaxation and straight steps seem to be related. We also report related observations for Al deposited on Ag(100).

Comments

This article is from Physical Review B 67, no. 15 (2003): 144501, doi:10.1103/PhysRevB.67.155401.

Copyright Owner

American Physical Society

Language

en

File Format

application/pdf

Share

COinS