Document Type
Article
Publication Date
2005
Journal or Book Title
Physical Review Letters
Volume
95
Issue
13
First Page
136802
DOI
10.1103/PhysRevLett.95.136802
Abstract
The electric field of dipoles localized at the atomic steps of metal surfaces due to the Smoluchowski effect were measured from the electrostatic force exerted on the biased tip of a scanning tunneling microscope. By varying the tip-sample bias the contribution of the step dipole was separated from changes in the force due to van der Waals and polarization forces. Combined with electrostatic calculations, the method was used to determine the local dipole moment in steps of different heights on Au(111) and on the twofold surface of an Al-Ni-Co decagonal quasicrystal.
Copyright Owner
American Physical Society
Copyright Date
2005
Language
en
File Format
application/pdf
Recommended Citation
Park, Jeong Young; Sacha, G. M.; Enachescu, M.; Ogletree, D. F.; Ribeiro, R. A.; Canfield, Paul C.; Jenks, Cynthia J.; Thiel, Patricia A.; Sáenz, J. J.; and Salmeron, M., "Sensing Dipole Fields at Atomic Steps with Combined Scanning Tunneling and Force Microscopy" (2005). Chemistry Publications. 48.
https://lib.dr.iastate.edu/chem_pubs/48
Included in
Biological and Chemical Physics Commons, Materials Science and Engineering Commons, Physical Chemistry Commons
Comments
This article is from Physical Review Letters 95, no. 13 (2005): 136802, doi:10.1103/PhysRevLett.95.136802.