Campus Units

Aerospace Engineering, Center for Nondestructive Evaluation

Document Type

Article

Conference

42nd Annual Review of Progress in Quantitative Nondestructive Evaluation

Publication Date

2016

Journal or Book Title

AIP Conference Proceedings

Volume

1706

First Page

050004-1

Last Page

050004-10

DOI

10.1063/1.4940503

Conference Title

42nd Annual Review of Progress in Quantitative Nondestructive Evaluation

Conference Date

26–31 July 2015

City

Minneapolis, Minnesota

Abstract

Analytical computer models of UT measurements are becoming more prominent in evaluating NDEmethods – a process known as Model Assisted Probability of Detection, or MAPOD. As inspection requirements become more stringent, the respective models become more complex. An important application for aerospace structures involves inspection for cracks near boltholes in plate and layered structures. This paper describes a project to develop and validate analytical models for bolthole crackinspection, as well as to implement and demonstrate those models within an integrated graphical interface which can be used to simulate these inspections. The work involves a combination of approximate, paraxial, bulk-wave models as well as more rigorous, analytical models that include both bulk and surface/plate modes. The simpler models have greater flexibility and efficiency for handling complex geometry, while the more exact models are useful for benchmarking and assessing the accuracy of the paraxial versions. Model results will be presented for bolthole cracks in single layered components. Extensions of the models to multiple layers and to more complex geometries and materials will also be discussed.

Comments

The following article appeared in AIP Conference Proceedings 1706 (2016): 050004 and may be found at doi: 10.1063/1.4940503.

Rights

Copyright 2016 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

Copyright Owner

American Institute of Physics

Language

en

File Format

application/pdf

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