Campus Units

Mechanical Engineering, Center for Nondestructive Evaluation

Document Type

Article

Conference

40th Annual Review of Progress in Quantitative Nondestructive Evaluation

Publication Date

2014

Journal or Book Title

AIP Conference Proceedings

Volume

1581

First Page

1840

Last Page

1847

DOI

10.1063/1.4865047

Conference Title

40th Annual Review of Progress in Quantitative Nondestructive Evaluation

Conference Date

21–26 July 2013

City

Baltimore, Maryland

Abstract

The need for robust defect detection in NDE applications requires the identification of subtle, low-contrast changes in measurement signals usually in very noisy data. Most algorithms rarely perform at the level of a human inspector and often, as data sets are now routinely 10+ Gigabytes, require laborious manual inspection. We present two automated defect segmentation methods, simple threshold and a binomial hypothesis test, and compare effectiveness of these approaches in noisy data with signal to noise ratios at 1:1. The defect-detection ability of our algorithm will be demonstrated on a 3D CT volume, UT C-scan data, magnetic particle images, and using simulated data generated by XRSIM. The latter is a physics-based forward model useful in demonstrating the effectiveness of data processing approaches in a simulation which includes complex defect geometry and realistic measurement. These large data setsrepresent significant demands on compute resources and easily overwhelm typical PC platforms; however, the emergence of graphics processing units(GPU) processing power provides a means to overcome this bottleneck. Processing large, multi-dimensional datasets requires an optimal GPU implementation which addresses both computational complexity and memory-bandwidth usage.

Comments

The following article appeared in AIP Conference Proceedings 1581 (2014): 1840, and may be found at doi: 10.1063/1.4865047.

Rights

Copyright 2014 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

Copyright Owner

American Institute of Physics

Language

en

File Format

application/pdf

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