Document Type

Conference Proceeding

Conference

Review of Progress in Quantitative Nondestructive Evaluation

Publication Date

7-2010

City

San Diego, CA

Abstract

Previously, concentric coplanar capacitive sensors have been developed to quantitatively characterize the permittivity or thickness of one layer in multi‐layered dielectrics. Electrostatic Green’s functions due to a point source at the surface of one‐ to three‐layered test‐pieces were first derived in the spectral domain, under the Hankel transform. Green’s functions in the spatial domain were then obtained by using the appropriate inverse transform. Utilizing the spatial domain Green’s functions, the sensor surface charge density was calculated using the method of moments and the sensor capacitance was calculated from its surface charge. In the current work, the spectral domain Green’s functions are used to derive directly the integral equation for the sensor surface charge density in the spectral domain, using Parseval’s theorem. Then the integral equation is discretized to form matrix equations using the method of moments. It is shown that the spatial domain approach is more computationally efficient, whereas the Green’s function derivation and numerical implementation are easier for the spectral domain approach.

Comments

Copyright 2011 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

This article appeared in AIP Conference Proceedings 1335 (2011): 1647–1654 and may be found at http://dx.doi.org/10.1063/1.3592126.

Copyright Owner

American Institute of Physics

Language

en

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