Document Type

Conference Proceeding

Conference

Review of Progress in Quantitative Nondestructive Evaluation

Publication Date

7-2012

City

Denver, CO

Abstract

The time-of-flight diffraction (TOFD) technique is one of the most common sizing methods in practical use by industry today. This method was developed over 40 years ago and is based on the technology and state of knowledge present at that time. A combination of phased arrays and equivalent flaw sizing methods are proposed as the foundation for a new generation of sizing methods that go beyond TOFD sizing.

Comments

Copyright 2013 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

This article appeared in AIP Conference Proceedings 1511 (2012): 1817–1824 and may be found at http://dx.doi.org/10.1063/1.4789261.

Copyright Owner

American Institute of Physics

Language

en

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Article Location

 
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