10. Defect Characterization: Techniques
Pattern recognition techniques are currently being applied to many signal interpretation problems in nondestructive testing. Simulearning technology combines various aspects of wave propagation analysis, pattern recognition philosophy, and signal processing theory in such a way as to outline procedures and establish guidelines for solving many problems in flaw classification. A portion of this paper will be used to present flaw classification problem statements and potential solution techniques along with simple data and analysis techniques.
Rose, Joseph L.; Eisenstein, Bruce; Fehlauer, John; and Avioli, Michael, "Defect Characterization-Fundamental Flaw Classification Solution Potential" (1977). Proceedings of the ARPA/AFML Review of Progress in Quantitative NDE, July 1975–September 1976. 35.