7. Non Metallic NDE, Acoustic Microscopy
Recent progress on diagnosis and characterization of defects in hybrid microelectronic components us1ng a transmission scanning acoustic microscope (SAM) operating at 150 MHz is summarized. A simple method has been established to locate (in three dimensions) and classify the defects. The study also shows that two optically identical thick-film resistors having a ratio of 5 x 103 in resistance value exhibit a 43 db contrast in acoustic amplitude.
Wang, J. K.; Lee, C. C.; and Tsai, C. S., "Further Progress on Nondestructive Diagnosis of Hybrid Microelectronic Components Using Transmission Acoustic Microscopy" (1980). Proceedings of the DARPA/AFML Review of Progress in Quantitative NDE, July 1978–September 1979. 37.