Crop growth models are computer programs that integrate information on daily weather, genetics, management, soil characteristics, and pest stress to determine daily plant growth and subsequent yield. Researchers at Iowa State University (ISU) have used a soybean growth model as a tool to evaluate causes of yield variability in several fields in Iowa. The idea is to calibrate the model to mimic historic yields within small grids in a field. Once calibrated, the model can be used to evaluate performance of prescriptions over many different weather conditions.
Iowa State University
Batchelor, William D. and Paz, Joel Obien, "Crop growth models and yield variability" (1999). Integrated Crop Management News. 2169.
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