Campus Units

Electrical and Computer Engineering

Document Type

Presentation

Conference

2009 IEEE Workshop on Silicon Errors in Logic-System Effects (SELSE 2009)

Publication Version

Accepted Manuscript

Publication Date

2009

Conference Title

2009 IEEE Workshop on Silicon Errors in Logic-System Effects (SELSE 2009)

Conference Date

March 24-25, 2009

City

Stanford, CA

Abstract

In this paper, we address the issue of soft errors in random logic and develop solutions that provide fault tolerance capabilities without logic duplication. First, we present a circuit level soft error mitigation technique which allows systems to operate without the performance overhead of soft error detection and correction circuitry. This is achieved by sampling data using our Soft Error Mitigation (SEM) register cell, which uses a distributed and temporal voting scheme for soft error detection and correction. Next, we present a scheme to concurrently detect and correct soft and timing errors using a Soft and Timing Error Mitigation (STEM) register cell, which offers soft error protection in aggressive designs that allow overclocking. Timing annotated gate level simulations, using 45nm libraries, of a pipelined adder-multiplier circuit and five-stage DLX processor show that both of our techniques achieve near 100% fault coverage. For DLX processor, even under severe fault injection campaigns, SEM achieves an average performance improvement of 26.58% over a temporal Triple Modular Redundancy (TMR) voter based register cell, while STEM outperforms SEM by 27.42%.

Comments

This is a manuscript of the presentation Avirneni, Naga Durga Prasad, Viswanathan Subramanian, and Arun K. Somani. "Soft error mitigation schemes for high performance and aggressive designs." 2009 IEEE Workshop on Silicon Errors in Logic-System Effects (SELSE 2009). March 24-25, 2009, Stanford, CA. Posted with permission.

Rights

© 2009 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

Copyright Owner

IEEE

Language

en

File Format

application/pdf

Share

Article Location

 
COinS