Campus Units

Electrical and Computer Engineering

Document Type

Conference Proceeding

Conference

2009 Second International Conference on Dependability

Publication Version

Accepted Manuscript

Link to Published Version

https://doi.org/10.1109/DEPEND.2009.30

Publication Date

2009

Journal or Book Title

2009 Second International Conference on Dependability

DOI

10.1109/DEPEND.2009.30

Conference Title

2009 Second International Conference on Dependability

Conference Date

June 18-23, 2009

City

Athens, Greece

Abstract

Physical and environmental variations require the addition of safety margins to the clock frequency of digital systems, making it overly conservative. Aggressive, but reliable, dynamic clock frequency tuning mechanisms that achieve higher system performance, by adapting the clock rates beyond worst case limits, have been proposed earlier. Even though reliable over-clocking guarantees functional correctness, it leads to higher power consumption and overheating. As a consequence, reliable over-clocking without considering on-chip temperatures will bring down the lifetime reliability of the chip. In this paper, we analyze how reliable over-clocking impacts the on-chip temperature of microprocessors, and evaluate the effects of overheating, due to reliable dynamic over-clocking mechanisms, on the lifetime reliability of such systems. We, then, evaluate the effects of performing thermal throttling, a technique that clamps the on-chip temperature below a predefined value, on system performance and reliability. Our study shows that a reliably over-clocked system, along with dynamic thermal throttling, achieves around 25% performance improvement, while operating within 355 K.

Comments

This is a manuscript of a proceeding published as Subramanian, Viswanathan, Prem Kumar Ramesh, and Arun K. Somani. "Managing the impact of on-chip temperature on the lifetime reliability of reliably overclocked systems." In 2009 Second International Conference on Dependability (2009): DOI: 10.1109/DEPEND.2009.30. Posted with permission.

Rights

© 2009 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

Copyright Owner

IEEE

Language

en

File Format

application/pdf

Published Version

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