Campus Units

Electrical and Computer Engineering

Document Type

Article

Publication Version

Accepted Manuscript

Publication Date

8-2005

Journal or Book Title

IEEE Transactions on Signal Processing

Volume

53

Issue

8

First Page

3342

Last Page

3348

DOI

10.1109/TSP.2005.851173

Abstract

Abstract: We develop a model for characterizing amplitude and phase probability distributions of eddy-current signals and propose a maximum likelihood (ML) method for estimating the amplitude and phase distribution parameters from measurements corrupted by additive complex white Gaussian noise. The squared amplitudes and phases of the potential defect signals are modeled as independent, identically distributed (i.i.d.) random variables following gamma and von Mises distributions, respectively. Newton-Raphson iteration is utilized to compute the ML estimates of the unknown parameters. We also compute Crame/spl acute/r-Rao bounds (CRBs) for the unknown parameters and discuss initialization of the Newton-Raphson iteration. The proposed method is applied to analyze rotating-probe eddy-current data from steam-generator tube inspection in nuclear power plants. The obtained estimates can be utilized for maximum a posteriori (MAP) signal phase and amplitude estimation, as well as efficient feature extractors in a defect classification scheme. We present numerical examples with both real and simulated data to demonstrate the performance of the proposed methods.

Comments

This is a manuscript of an article from IEEE Transactions on Signal Processing 53 (2005): 3342, doi:10.1109/TSP.2005.851173. Posted with permission.

Rights

Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

Copyright Owner

IEEE

Language

en

File Format

application/pdf

Published Version

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