Campus Units

Electrical and Computer Engineering

Document Type

Article

Publication Date

6-2001

Journal or Book Title

Journal of Applied Physics

Volume

89

Issue

11

First Page

6473

Last Page

6480

DOI

10.1063/1.1365440

Abstract

The atomic force microscope(AFM) is a powerful tool for investigating surfaces at atomic scales. Harmonic balance and power balance techniques are introduced to analyze the tapping-mode dynamics of the atomic force microscope. The harmonic balance perspective explains observations hitherto unexplained in the AFM literature. A nonconservative model for the cantilever–sample interaction is developed. The energy dissipation in the sample is studied and the resulting power balance equations combined with the harmonic balance equations are used to estimate the model parameters. Experimental results confirm that the harmonic and power balance tools can be used effectively to predict the behavior of the tapping cantilever.

Comments

The following article appeared in Journal of Applied Physics 89, 6473 (2001); and may be found at doi: 10.1063/1.1365440.

Rights

Copyright 2001 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

Copyright Owner

American Institute of Physics

Language

en

File Format

application/pdf

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