Degree Type
Thesis
Date of Award
2012
Degree Name
Master of Science
Department
Computer Science
First Advisor
David M. Weiss
Abstract
In this thesis, we propose a black-box testing method that derives important test cases by including usage statistics, and enables a product manager to make a release decision with the rationale, "the important use cases specified in the usage statistics are tested and have no error."
First, we propose a method to specify components with Trace Function Method (TFM) module interface specifications. Then, we propose a way to associate module usage statistics with the TFM module interface specification. Finally, we propose a method to generate a prioritized list of black-box test cases for component testing and integration testing from the TFM module interface specification with usage statistics.
DOI
https://doi.org/10.31274/etd-180810-2882
Copyright Owner
Katsuya Iwata
Copyright Date
2012
Language
en
File Format
application/pdf
File Size
72 pages
Recommended Citation
Iwata, Katsuya, "Black-Box Test Case Generation from TFM Module Interface Specications and Usage Statistics" (2012). Graduate Theses and Dissertations. 12613.
https://lib.dr.iastate.edu/etd/12613
