Degree Type

Thesis

Date of Award

2012

Degree Name

Master of Science

Department

Mechanical Engineering

First Advisor

Xinwei Wang

Abstract

There is a wide variety of techniques available for characterizing the thermal transport in one-dimensional micro and nanoscale geometries. Two of these techniques have been used extensively to determine the properties of several different samples. The photothermal technique has been used to measure the thermophysical properties of thin films. A transient electrothermal (TET) technique has been used to measure the thermal diffusivity of micro/nanoscale wires and fibers. The TET technique has been modified to measure the thermal contact resistance between two crossed microwires. This contact transient electrothermal (CTET) technique characterizes heat transfer in a single point, essentially zero-dimensional heat transfer. The CTET technique was used to measure the thermal contact resistance between crossed Pt wires and between a glass fiber crossed with a Pt wire.

Copyright Owner

Nathan Van Velson

Language

en

File Format

application/pdf

File Size

75 pages

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