Date of Award
Master of Science
In this research study we focused on studying the tribological properties of materials using atomic force microscopy techniques (AFM). Especially the tribological properties of fiber materials like natural silks (spider and silkworm) and synthetic materials (Kevlar and Nylon) were studied at micro/nanoscales. It was found that the natural silks (spider silks, silkworm silks) exhibit lower coefficient of friction and work of adhesion values that the synthetic fibers (Kevlar, Nylon). While the natural silks exhibit comparable scratch resistance to the synthetic fibers at low loads, the synthetic fibers tend to exhibit significantly better scratch resistance at higher loads.
Durability of AFM tips were also studied by measuring the change in tip radius of the AFM tips and also utilized the atom probe tomographic (APT) techniques to examine the AFM tips. The measure of change in tip radius indicates the wear resistance of the tips. It was founded that coated tips (silicon nitride and DLC) has good wear resistance compared to pure Si tips and is also confirmed in APT studies.
Srinath R. Kistampally
Kistampally, Srinath R., "Micro/nanotribological studies of materials using Atomic force microscopy" (2013). Graduate Theses and Dissertations. 13280.