Campus Units

Industrial and Manufacturing Systems Engineering, Statistics

Document Type

Article

Publication Version

Accepted Manuscript

Publication Date

2014

Journal or Book Title

IIE Transactions

Volume

46

Issue

2

First Page

118

Last Page

130

DOI

10.1080/0740817X.2013.770185

Abstract

The most direct purpose of collecting warranty data is tracking associated costs. However, they are also useful for quantifying a relationship between use rate and product time-to-first-failure and for estimating the distribution of product time-to-first-failure (which is modeled in this article as depending on use rate and a unit potential life length under continuous use). Employing warranty data for such reliability analysis purposes is typically complicated by the fact that some parts of some warranty data records are missing. A pseudo-likelihood methodology is introduced to deal with some kinds of incomplete warranty data (such as that available in a motivating real case from a machine manufacturer). A use rate distribution, the distribution of time to first failure, and the time associated with a cumulative probability of first failure are estimated, based on the proposed approach and available data.

Comments

This is an Accepted Manuscript of an article published by Taylor & Francis in IIE Transactions on February 8, 2013, available online: http://www.tandfonline.com/10.1080/0740817X.2013.770185

Creative Commons License

Creative Commons Attribution-Noncommercial-No Derivative Works 3.0 License
This work is licensed under a Creative Commons Attribution-Noncommercial-No Derivative Works 3.0 License.

Copyright Owner

Taylor & Francis

Language

en

File Format

application/pdf

Published Version

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