Campus Units

Industrial and Manufacturing Systems Engineering, Statistics

Document Type

Article

Publication Version

Accepted Manuscript

Publication Date

2010

Journal or Book Title

The American Statistician

Volume

64

Issue

1

First Page

46

Last Page

51

DOI

10.1198/tast.2009.09079

Abstract

How the sources of physical variation interact with a data collection plan determines what can be learned from the resulting dataset, and in particular, how measurement error is reflected in the dataset. The implications of this fact are rarely given much attention in most statistics courses. Even the most elementary statistical methods have their practical effectiveness limited by measurement variation; and understanding how measurement variation interacts with data collection and the methods is helpful in quantifying the nature of measurement error. We illustrate how simple one- and two-sample statistical methods can be effectively used in introducing important concepts of metrology and the implications of those concepts when drawing conclusions from data.

Comments

This is an Accepted Manuscript of an article published by Taylor & Francis in The American Statistician on January 1, 2012, available online: http://www.tandfonline.com/10.1198/tast.2009.09079.

Copyright Owner

American Statistical Association

Language

en

File Format

application/pdf

Published Version

Share

COinS