Document Type
Abstract
Conference
221st ECS Meeting
Publication Date
5-2012
City
Seattle, WA
Abstract
Anodization1 as well as dissolution2 of reactive metals such as aluminum results in buildup of significant levels of stresses on the reacting surface. In-situ measurement of stress evolution can provide remarkable insights into the associated electrochemical reactions and help in understanding the governing mechanisms. We report a curvature interferometry based technique for in-situ monitoring of stress evolution. Curvature interferometer is incorporated into the electrochemical cell and is used to monitor the curvature changes of the samples in order to determine the stress-thickness product of the film formed on the reacting surface.
Copyright Owner
The Electrochemical Society
Copyright Date
2012
Language
en
Recommended Citation
Çapraz, Ömer Ö.; Shrotriya, Pranav; and Hebert, Kurt R., "Curvature Interferometry based In-Situ Measurement of Stresses Associated with Electrochemical Reactions" (2012). Mechanical Engineering Conference Presentations, Papers, and Proceedings. 5.
https://lib.dr.iastate.edu/me_conf/5
