Interferometry XVI: Techniques and Analysis
San Diego, CA
Our recent study found that it is very difficult to use the binary defocusing technique to completely suppress the 3rd-order harmonics, and thus it is challenging to achieve high-quality three-dimensional (3-D) measurement with the Fourier transformation method. This paper presents a novel approach to effectively eliminate the 3rd order harmonics by modulating the binary structured patterns in both x and y directions. Both simulation and experimental results will be presented to verify the performance of the proposed technique.
Society of Photo-Optical Instrumentation Engineers
Lohry, William F. and Zhang, Song, "Improve Fourier transform profilometry by locally area modulating squared binary structured pattern" (2012). Mechanical Engineering Conference Presentations, Papers, and Proceedings. 63.